Photostress: A Proven Optical Method for Stress Analysis

 MM Matrix Integrity (M) Sdn Bhd (Malaysia) invited PETRONAS Group Technical Solutions to observe a demonstration of the PhotoStress® method. The demonstration’s purpose was to confirm that the PhotoStress® technology is reliable for measuring surface strain at defect and away from the defect areas (nominal). Qualitative and quantitative analyses were performed on a carbon steel pipe spool, and results were validated against strain gage readings and empirical values.

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Kevin Swiger

United States